License: This is an open access protocol distributed under the terms of the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited Protocol status: WorkingWe use this protocol and it's working
Created: March 31, 2026
Last Modified: April 27, 2026
Protocol Integer ID: 314220
Keywords: confocal reflection microscopy, free imaging confocal reflection microscopy, nikon advanced microscopy, depth explanation of confocal reflection microscopy, allowing reflection microscopy, reflection microscopy, nikon ax confocal tunable detector, fluorescence imaging, reflection imaging, confocal reflection label, confocal tunable detector, fluorescence, opaque substrate, like imaging, nikon axe, laser light, autofluorescence, substrate, stained sample, cell, label free brightfield